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產品名稱:ETALON probes
產品說明
ETALON 是一款全新設計有優良表現的AFM探針,在品質與價格上有優於目前市面上其他探針的優點
產品應用

Thickness oscillations in a self-assembled PS-b-PMMA film on a Si substrate

Author: Mrs. Denise Erb

Organization: Deutsches Elektronensynchrotron

Scan size: 10 x 10 µm

Probes used: HA_NC

Pyramidal Germanium quantum dots that are formed during the growth at the rim of a pit that was etched into the Si substrate. The color coding of the image (that is the same as No. 81) shows the local surface slope (inclination) with respect to the (001) substrate surface.

Author: Dr. Martyna Grydlik
Organization: University of Linz
Scan size: 800 x 800 nm
Probes used: HA_NC

 

Image of a dislocated Silicon-Germanium quantum dot grown on a Si(001) substrate.
To reveal the true nature and character of this quantum dot as a first step based on the height image the first derivative in x-direction was generated. Hereafter, the local surface slope with respect to the substrate plane was calculated.
 
Author: Dr. Moritz Brehm
Organization: Institute of Semiconductor and Solid State Physics
Scan size: 1.3x1.3 µm
Probes used: HA_NC
The AFM images of surface of cold substrate after process of laser deposition of pyrolitic graphite.
Forming ring-like structures.
 
Author: Mrs. Stella Kutrovskaya
Organization: Vladimir State University
Scan size: 50x50 um
Probes used: HA_NC
The remaining polystyrene block of a thin film of the diblock copolymer PS-b-PMMA on Si, after microphase separation and removal of the polymetylmethacrylate block.
 
Author: Mrs. Denise Erb
Organization: Deutsches Elektronensynchrotron
Scan size: 10 x 10 µm
Probes used: HA_NC
Fabrication of nanoholes umder Au Thin films for SPR (Surface Plasmon Ressonances)sensors.
 
Author: Ms. Mara Adriana Canesqui
Organization: Center for Semiconductor Components (CCS) of the State University of Campinas (UNICAMP), Brasil
Scan size: 2x2 um
Probes used: HA_NC
Silver deposited by magnetron sputtering onto a self-assembled diblock-copolymer PS-b-PMMA thin film.
 
Author: Mrs. Denise Erb
Organization: Deutsches Elektronensynchrotron
Scan size: 1 x 1 µm
Probes used: HA_NC
產品規格

Noncontact/Semicontact/Force Modulation AFM probes ETALON series

AFM cantilevers ETALON series for Noncontact/Semicontact/Force Modulation Modes with wide range of resonant frequencies and force constants.
Supplied with Au reflective coating, available without tips, with no coatings, with Pt conductive coating.

 
High Accuracy High Resonance frequency noncontact AFM probes HA_HR series, each chip has 2 cantilevers, resonant frequency 380 kHz / 230 kHz, force constant 34 N/m / 17 N/m.
 
High Accuracy Force Modulation AFM probes HA_FM series, each chip has 2 cantilevers, resonant frequency 114 kHz / 77 kHz, force constant 6 N/m / 3.5 N/m.
 
High Accuracy NonContact AFM probes HA_NC series, each chip has 2 cantilevers, resonant frequency 235 kHz / 140 kHz, force constant 12 N/m / 3.5 N/m.


Conductive AFM probes ETALON series

AFM cantilevers ETALON series for Conductive modes (SCM, SKM, SRI, EFM, I-V curve spectroscopy, voltage lithography) with Pt conductive coating, supplied with wide range of resonant frequencies and force constants.

 

 
High Accuracy High Resonance frequency noncontact AFM probes HA_HR series with Pt conductive coating, each chip has 2 cantilevers, resonant frequency 380 kHz / 230 kHz, force constant 34 N/m / 17 N/m.
 
High Accuracy Force Modulation AFM probes HA_FM series with Pt conductive coating, each chip has 2 cantilevers, resonant frequency 114 kHz / 77 kHz, force constant 6 N/m / 3.5 N/m.
 
High Accuracy NonContact AFM probes HA_NC series with Pt conductive coating, each chip has 2 cantilevers, resonant frequency 235 kHz / 140 kHz, force constant 12 N/m / 3.5 N/m.
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