今天是
NT-MDT
產品名稱:TOP VISUAL probes
產品說明
TOP VISUAL non-contact AFM probes. For precise positioning of the tip over the point of interest and for direct real-time observation of sample scanning and modification (nanomanipulation) processes. For precise positioning of a tightly focused laser spot at the tip end - for investigations of optical effects between tip and sample (TERS, TEFS, s-SNOM etc).


產品應用
1.  For precise positioning of the tip over the point of interest and for direct real-time observation of sample scanning and modification (nanomanipulation) processes. 
2. For precise positioning of a tightly focused laser spot at the tip end - for investigations of optical effects between tip and sample (TERS, TEFS, s-SNOM etc).


 
 
Image in optical microscope 
(TOP VISUAL probe is under the investigated sample).
 
 

Topography image of the sample made by TOP VISUAL probe.
 



產品規格

Material Si
Chip size 3.4x1.6x0.3mm
Reflective side coating None
Front coating None
Cantilever number 1 rectangular
Tip curvature radius typical 6nm, guaranteed 10nm
Tip shape Pyramidal
Tip height 14-16 um


Cantilever series Cantilever length, L±5µm Cantilever width, W±3µm Cantilever thickness,
T±0.5 µm
Resonant frequency, kHz Force constant, N/m
min typical max min typical max
VIT_P 140 50 5.0 200 300 400 25 50 95

 
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