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產品名稱:Whisker Type probes
產品說明
"Whisker Type" probes are specially designed for researching deep trenches and control of near vertical sidewalls. Any inclination angle to match the SPM holder specification and different Whisker tip length can be produced at customer's requirement.


產品應用



 

On the Fig.4 SPM images of the structure obtained by difrerent probes are shown – standard probe (on the left, Fig.4) and probe with "Whisker" tip(on the right, Fig.4). The width of gaps was about 100 nm. These images show the main advantage of the whisker: it goes much deeper and gives a uniform distribution of pattern, while the standard one fails even to reach the bottom!


 
Fig. 4 On the left – results of imaging by the standard probe, the depth was only 170 nm reached.While the wisker achieved the bottom (530 nm) and showed a uniform distribution.



產品規格

Noncontact/Semicontact "Whisker Type" probes


 
"Whisker Type" probes for noncontact/semicontact modes with whisker inclination angle 10 degrees.
 
"Whisker Type" probes for noncontact/semicontact modes with whisker inclination angle 20 degree


Contact "Whisker Type" probes

SPECIAL OFFER from 1st till 30th of March!
"Whisker Type" probes for contact modes with whisker inclination angle 10 degree
 
"Whisker Type" probes for contact modes with whisker inclination angle 20 degree.
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